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Hitachi High-Tech Europe | Electron Microscopes and Ion Beam Systems
Hitachi High-Tech Europe | Introducing the Hitachi High-Tech TM4000PlusIII
![[Electronics] Sample orientation control for backside FIB milling](https://i.ytimg.com/vi/jkCqosco1p4/hq720.jpg?sqp=-oaymwEjCOgCEMoBSFryq4qpAxUIARUAAAAAGAElAADIQj0AgKJDeAE=&rs=AOn4CLDMFF737saP6bR8VZjA5Mc-2pMfIQ)
[Electronics] Sample orientation control for backside FIB milling
Hitachi High-Tech Europe | Introducing the Hitachi High-Tech SU3800 & SU3900 SEMs
![[Life] 3D Imaging of HeLa Cell using FIB-SEM](https://i.ytimg.com/vi/fiT0ZZUZxRU/hq720.jpg?sqp=-oaymwEjCOgCEMoBSFryq4qpAxUIARUAAAAAGAElAADIQj0AgKJDeAE=&rs=AOn4CLDer1fdzZcULay3UVurKsRDK1vIlQ)
[Life] 3D Imaging of HeLa Cell using FIB-SEM
![[Electronics] Site-specific TEM lamella prep of 14 nm FinFET using Real-time STEM on L-shape FIB-SEM](https://i.ytimg.com/vi/GJjzs2bjYqE/hq720.jpg?sqp=-oaymwEjCOgCEMoBSFryq4qpAxUIARUAAAAAGAElAADIQj0AgKJDeAE=&rs=AOn4CLBdApEUgwyAB0EplpKcdmjuEBEEBA)
[Electronics] Site-specific TEM lamella prep of 14 nm FinFET using Real-time STEM on L-shape FIB-SEM
![[Electronics] Site-specific cross sectioning using Review SEM & Wafer FIB SEM](https://i.ytimg.com/vi/3TMorQ-5kfo/hq720.jpg?sqp=-oaymwEjCOgCEMoBSFryq4qpAxUIARUAAAAAGAElAADIQj0AgKJDeAE=&rs=AOn4CLDx7-t_UMXRfoLX9ab2qw0IfNeYHg)
[Electronics] Site-specific cross sectioning using Review SEM & Wafer FIB SEM
![[Electronics] Voltage Contrast imaging of a 5 nm process SRAM](https://i.ytimg.com/vi/H7EIrQpHBtw/hq720.jpg?sqp=-oaymwEjCOgCEMoBSFryq4qpAxUIARUAAAAAGAElAADIQj0AgKJDeAE=&rs=AOn4CLDpfPMXITNs4Ug0-2l57Hh_o2JutA)
[Electronics] Voltage Contrast imaging of a 5 nm process SRAM